For the typical color detects of polysilicon wafers, i.e., edge discoloration, color inaccuracy and color non-uniformity, a new integrated machine vision detection method is proposed based on an HSV color model. By transforming RGB image into three-channel HSV images, the HSV model can efficiently reduce the disturbances of complex wafer textures. A fuzzy color clustering method is used to detect edge discoloration by defining membership function for each channel image. The mean-value classi- fying method and region growing method are used to identify the other two defects, respectively. A vision detection system is developed and applied in the produc- tion of polysilicon wafers.
数据挖掘方法可以从已有的设计知识数据库中提取用户需求和设计需求之间的关联规则,辅助产品服务系统(product service system,PSS)规划分析。Apriori算法是常用的基于静态数据库的关联规则挖掘方法。实际上,设计知识数据库是不断动态更新的,关联规则库也需要更新。针对这个问题,提出了基于Apriori的改进关联规则挖掘方法和增量式更新算法以辅助PSS规划分析。关联规则挖掘方法中将新增一个竞争集合储存有希望成为规则的项集。考虑新增数据库具有较强的创新意义,增量式更新算法将基于数据库加权策略更新规则库。以某计量泵企业的PSS规划设计为例,验证了所提方法的有效性。
