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国家自然科学基金(s90201025)

作品数:3 被引量:2H指数:1
发文基金:国家自然科学基金国家教育部博士点基金更多>>
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Synthesis of GaN films on porous silicon substrates
2006年
一个新奇、简单的方法被采用综合在多孔的硅(PS ) 上轧了电影底层。轧了电影通过在与磁控管劈啪作响在底层上扔的 NH_3 和 Ga_2O_3 电影之间的反应被获得。后来轧了并且 PS 都是为光的好材料,获得一些新性质从被期望在 PS 上轧了。样品与 X 光检查衍射(XRD ) 被分析识别晶体结构。Fourier 播送红外线(FTIR ) 光谱被用来分析样品的化学状态。电影是装电子显微镜学(SEM ) 的观察 withs 并且被发现由许多大水晶谷物组成。光致发光(PL ) 光谱被用来照亮光性质轧了电影。
DONG Zhihua XUE Chengshan ZHUANG Huizhao GAO Haiyong TIAN Deheng WU Yuxin
关键词:多孔硅半导体技术磁控溅射
Synthesis of large-scale GaN nanowires by ammoniating Ga_2O_3 films on Co layer deposited on Si(111) substrates
2008年
A mass of GaN nanowires has been successfully synthesized on Si(111) substrates by magnetron sputtering through ammoniating Ga2O3/Co films at 950℃. X-ray diffraction, scanning electron microscopy, high resolution transmission electron microscope and Fourier transformed infrared spectra are used to characterize the samples. The results demonstrate that the nanowires are of single-crystal GaN with a hexagonal wurtzite structure and possess relatively smooth surfaces. The growth mechanism of GaN nanowires is also discussed.
秦丽霞薛成山庄惠照杨兆柱陈金华李红
关键词:NANOWIRES
Synthesis and structural characterization of Zn_3N_2 powder被引量:2
2005年
Zinc nitride (Zn3N2) powder has been synthesized through the nitridation reaction of Zn powder with NH3 gas (at the flow rate of 500 ml/min) at the nitridation temperature of 600℃ for 120 min. X-ray diffraction (XRD) indicates that Zn3N2 is cubic in structure with the lattice constant being a = 0.9788 nm. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) show that Zn3N2 powder has surface morphology of various types. X-ray photoelectron spectroscopy (XPS) shows the differences in chemical bonding states between Zn3N2 and ZnO, and confirms the formation of N–Zn bonds. Observation through high resolution transmission electron microscopy (HRTEM) also indicates that the computer simulation of the structure of Zn3N2 is consistent with the structural model put forward by Partin.
ZONG Fujian1, MA Honglei1, XUE Chengshan2, ZHUANG Huizhao2, ZHANG Xijian1, MA Jin1, JI Feng1 & XIAO Hongdi1 1. School of Physics and Microelectronics, Shandong University, Jinan 250100, China
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