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国家教育部博士点基金(200801860003)

作品数:3 被引量:7H指数:2
相关作者:王洋熊峥秦旭磊王国政王蓟更多>>
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硅微通道阵列光电化学腐蚀中通道尺寸控制技术被引量:5
2010年
高长径比硅微通道阵列在光子晶体、硅微通道板、MEMS器件等领域应用前景广阔。本文开展了硅微通道阵列光电化学方法腐蚀实验,重点研究了孔径控制技术。给出了型硅在氢氟酸溶液中的电流-电压扫描曲线,讨论了临界电流密度JPS的意义,提出了一种间接地测量JPS与腐蚀时间关系的方法,研究了暗电流密度与腐蚀时间关系及对腐蚀的影响。根据暗电流及JPS的变化规律调整腐蚀电流,实现了对孔径的控制,制备出通道深度为300m,长径比为100的硅微通道阵列结构。
王国政熊峥王蓟秦旭磊付申成王洋端木庆铎
关键词:暗电流密度
Influence of etching current density on the morphology of macroporous silicon arrays by photo-electrochemical etching被引量:2
2010年
Macroporous silicon arrays(MSA) have attracted much attention for their potential applications in photonic crystals,silicon microchannel plates,MEMS devices and so on.In order to fabricate perfect MSA structure,photo-electrochemical (PEC) etching of MSA and the influence of etching current on the pore morphology were studied in detail.The current-voltage curve of a polished n-type silicon wafer was presented in aqueous HF using back-side illumination.The critical current density J_(PS) was discussed and the basic condition of etching current density for steady MSA growth was proposed.An indirect method was presented to measure the relation of J_(PS) at the pore tip and etching time.MSA growth was realized with the pore diameter constant by changing the etching current density according to the measuring result of J_(PS).MSA with 295μm of depth and 98 of aspect ratio was obtained.
王国政陈立秦旭磊王蓟王洋付申成端木庆铎
Influence of voltage on photo-electrochemical etching of n-type macroporous silicon arrays被引量:1
2010年
The influence of voltage on photo-electrochemical etching(PEC) of macroporous silicon arrays(MSA) was researched.According to the theory of the space charge region,I-V scan curves and the reaction mechanism of the n-type silicon anodic oxidation in HF solution under different current densities,the pore morphology influenced by the working voltage were studied and analyzed in detail.The results show that increasing the etching voltage will lead to distortion of the pore morphology,decreasing etching voltage will result in an increase in the blind porosity, and the constant etching voltage for a long time will cause gradual bifurcation.Through the optimization of the process parameters,the perfect MSA structure with a pore depth of 317μm,a pore size of 3μm and an aspect ratio of 105 was obtained.
王国政付申成陈立王蓟秦旭磊王洋郑仲馗端木庆铎
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