We introduce the relationship between excess noise in Optoelectronic Coupled Devices (OCDs) and their interior defects and explain how low-fiequency noise can be used to estimate their reliability.Using concepts from the biological immune system and its process of identifying invaders,we present a system for estimation of the reliability of OCDs.The system has expressions for the antigen (excess noise),lymphocyte (criterion) and the role of the lymphocyte eliminating unreliable devices. A genetic algorithm was used to estimate the components parameters of the noise spectrum for estimating the reliability of OCDs.The experimental results demonstrated that this method is reliable,adaptable and practical.
Dan-e Wu~1 Qiu-zhan Zhou~1 Ping-ping Liu~2 He-bin Zhang1.College of Communication Engineering,Jilin University,Changehun 130022,P.R.China2.Department of Computer Science and Technology,Jilin University,Changchun 130012,P.R.China
This paper present a fast and simple medical image enhancing method based on locally redistributed histograms,...
HE Jin-qi1,2,ZHANG Li-ping3,Dai Hongliang4,WAN Chun-ming2 1.Changchun Institute of Optics,fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China.2.College of Science Changchun University of Science and Technology,Jilin 130022,China
