提出了一种应用于超高频(Ultra high frequency,UHF)射频识别(Radio frequency identification,RFID)标签芯片的射频测试技术。针对UHF RFID标签芯片射频电路的特殊工作方式,该技术可对芯片的输入阻抗和灵敏度进行准确测量,并同时完成芯片功能验证。与传统的RFID标签芯片射频测试技术相比,文中的方案利用商用阅读器和可调衰减器代替了高端或RFID专用测试设备,因此极大降低了测试成本。利用该测试方案,对已开发的UHF RFID标签芯片进行了测试与验证,并利用测试结果完成了折叠偶极子天线设计以实现芯片与天线之间的阻抗匹配。将芯片与天线组装成无源标签,其灵敏度可达-10.5 dBm。实验结果证明了该方案的正确性。
This paper presents a low power and high efficiency high voltage generator circuit embedded in electrically erasable programmable read-only memory（EEPROM）.The low power is minimized by a capacitance divider circuit and a regulator circuit using the controlling clock switch technique.The high efficiency is dependent on the zero threshold voltage(Vth) MOSFET and the charge transfer switch（CTS） charge pump.The proposed high voltage generator circuit has been implemented in a 0.35μm EEPROM CMOS process.Measured results show that the proposed high voltage generator circuit has a low power consumption of about 150.48μW and a higher pumping efficiency（83.3%） than previously reported circuits.This high voltage generator circuit can also be widely used in low-power flash devices due to its high efficiency and low power dissipation.
