The elastic microstrains in a crystallite of electrodeposited nanocrystalline copper were investigated by analyzing the high resolution electron microscopy (HRTEM) image. The microstrain was considered as consisting of two parts, in which the uniform part was determined with fast Fourier transformation of the HRTEM image, while the non-uniform part of the microstrain in the crystallite was measured by means of peak finding. Atomic column spacing measurements show that the crystal lattice is contracted in the longitudinal direction, while expanded in the transverse direction of the elliptical crystallite, indicating that the variation of microstrain exists mainly near the grain boundary.
