An efficient Galerkin meshfree formulation for three dimensional simulation of large deformation failure evolution in soils is presented. This formulation utilizes the stabilized conforming nodal integration, where for the purpose of stability and efficiency a Lagrangian smoothing strain at nodal point is constructed and thereafter the internal energy is evaluated nodally. This formulation ensures the linear exactness, efficiency and spatial stability in a unified manner and it makes the conventional Galerkin meshfree method affordable for three dimensional simulation. The three dimensional implementation of stabilized conforming nodal integration is discussed in details. To model the failure evolution in soil medium a coupled elasto-plastic damage model is used and an objective stress integration algorithm in combination of elasto-damage predictor and plastic corrector method is employed for stress update. Two typical numerical examples are shown to demonstrate the effectiveness of the present method for modeling large deformation soil failure.
The thin stiff films on pre-stretched compliant substrates can form wrinkles, which can be controlled in micro and nanoscale systems to generate smart structures. Recently, buck- led piezoelectric/ferroelectrie nanoribbons have been reported to show an enhancement in the piezoelectric effect and stretchability, which can be applied in energy harvesting devices, sensors and memory devices instead of polymeric polyvinylidine fluoride （PVDF）. This paper studies the buckling and post-buckling process of ferroelectric thin films bonded to the pre-stretched soft layer, which in turn lies on a rigid support. Nonlinear electromechanical equations for the buckling of thin piezoelectric plates are deduced and employed to model the ferroelectric film poled in the thickness direction. Two buckling modes are analyzed and discussed： partially de-adhered buck- ling and fully adhered buckling. Transition from one buckling mode to the other is predicted and the effect of piezoelectricity on the critical buckling condition of piezoelectric film is examined.
