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国家自然科学基金(51171036)

作品数:5 被引量:23H指数:3
相关作者:赵宁黄明亮马海涛刘晓英潘学民更多>>
相关机构:大连理工大学更多>>
发文基金:国家自然科学基金国家教育部博士点基金中央高校基本科研业务费专项资金更多>>
相关领域:金属学及工艺电气工程电子电信更多>>

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Cu-Ni交互作用对Cu/Sn/Ni焊点液固界面反应的影响被引量:4
2013年
研究Cu/Sn/Ni焊点在250℃液固界面反应过程中Cu-Ni交互作用对界面反应的影响。结果表明:液固界面反应10 min后,Cu-Ni交互作用就已经发生,Sn/Cu及Sn/Ni界面金属间化合物(IMCs)由浸焊后的Cu6Sn5和Ni3Sn4均转变为(Cu,Ni)6Sn5,界面IMCs形貌也由扇贝状转变为短棒状。在随后的液固界面反应过程中,两界面IMCs均保持为(Cu,Ni)6Sn5类型,但随着反应的进行,界面IMC的形貌变得更加凸凹不平。Sn/Cu和Sn/Ni界面IMCs厚度均随液固界面反应时间的延长不断增加,界面IMCs生长指数分别为0.32和0.61。在液固界面反应初始阶段,Sn/Cu界面IMC的厚度大于Sn/Ni界面IMC的厚度;液固界面反应2 h后,由于Cu-Ni交互作用,Sn/Cu界面IMC的厚度要小于Sn/Ni界面IMC的厚度,并在液固界面反应6 h后分别达到15.78和23.44μm。
黄明亮陈雷达赵宁
关键词:CUSN金属间化合物
液态Sn-Cu钎料的黏滞性与润湿行为研究被引量:5
2013年
金属熔体的黏度和表面张力都是与液态结构相关的敏感物理性质,且存在一定的相互关系.对于微电子封装材料而言,黏度和表面张力均是影响其工艺性能的重要参量.本文利用回转振动式高温熔体黏度仪测量了Sn-xCu(x=0.7,1.5,2)钎料熔体在不同温度下的黏度值,发现在一定温度范围内钎料熔体的黏度值存在突变,可划分为低温区和高温区.在各温区内,黏温关系很好地符合Arrhenius方程,在此基础上讨论了液态钎料的结构特征和演变规律.同时,利用黏度值计算了液态Sn-xCu钎料在相应温度下的表面张力,并通过Sn-xCu钎料在Cu基板上的润湿铺展实验对计算结果进行验证.结果显示,润湿角和扩展率的测试结果与表面张力的计算结果具有很好的一致性,表明通过熔体黏度值来计算锡基二元无铅钎料合金表面张力并评估其润湿性能的方法是可行的.
赵宁黄明亮马海涛潘学民刘晓英
关键词:黏度润湿性
Different Diffusion Behavior of Cu and Ni Undergoing Liquidesolid Electromigration被引量:1
2014年
The diffusion behavior of Cu and Ni atoms undergoing liquidesolid electromigration(L-S EM) was investigated using Cu/Sn/Ni interconnects under a current density of 5.0 103A/cm2 at 250℃. The flowing direction of electrons significantly influences the cross-solder interaction of Cu and Ni atoms, i.e., under downwind diffusion, both Cu and Ni atoms can diffuse to the opposite interfaces; while under upwind diffusion,Cu atoms but not Ni atoms can diffuse to the opposite interface. When electrons flow from the Cu to the Ni, only Cu atoms diffuse to the opposite anode Ni interface, resulting in the transformation of interfacial intermetallic compound(IMC) from Ni3Sn4into(Cu,Ni)6Sn5and further into [(Cu,Ni)6Sn5t Cu6Sn5], while no Ni atoms diffuse to the opposite cathode Cu interface and thus the interfacial Cu6Sn5 remained.When electrons flow from the Ni to the Cu, both Cu and Ni atoms diffuse to the opposite interfaces,resulting in the interfacial IMC transformation from initial Cu6Sn5into(Cu,Ni)6Sn5and further into[(Cu,Ni)6Sn5t(Ni,Cu)3Sn4] at the anode Cu interface while that from initial Ni3Sn4into(Cu,Ni)6Sn5and further into(Ni,Cu)3Sn4at the cathode Ni interface. It is more damaging with electrons flowing from the Cu to the Ni than the other way.
M.L.HuangZ.J.ZhangH.T.MaL.D.Chen
关键词:电迁移原子扩散金属间化合物电流密度
Effect of Ni Content on Mechanical Properties and Corrosion Behavior of Al/Sn-9Zn-xNi/Cu Joints被引量:11
2012年
The effects of Ni content on the microstructure and the wetting behavior of Sn-9Zn-xNi solders on Al and Cu substrates, as well as the mechanical properties and electrochemical corrosion behavior of Al/Sn-9Zn-xNi/Cu solder joints, were investigated. The microstructure of Sn-9Zn-xNi revealed that tiny Zn and coarsened Ni 5 Zn 21 phases dispersed in the β-Sn matrix. The wettability of Sn-9Zn-xNi solders on Al substrate was much better than that on Cu substrate. With increasing Ni content, the wettability on Cu substrate was slightly improved but became worse on Al substrate. In the Al/Sn-9Zn-xNi/Cu joints, an Al4.2Cu3.2Zn0.7 intermetallic compound (IMC) layer formed at the Sn-9Zn-xNi/Cu interfaces, while an Al-Zn-Sn solid solution layer formed at the Sn-9Zn-xNi/Al interface. The mixed compounds of Ni3Sn4 and Al3Ni dispersed in the solder matrix and coarsened with increasing Ni content, thus leading to a reduction in shear strength of the Al/Sn-9Zn-xNi/Cu joints. Al particles were segregated at both interfaces in the solder joints. The corrosion potentials of Sn-9Zn-xNi solders continuously increased with increasing Ni content. The Al/Sn-9Zn-0.25Ni/Cu joint was found to have the best electrochemical corrosion resistance in 5% NaCl solution.
M.L.HuangN.KangQ.ZhouY.Z.Huang
关键词:电化学腐蚀行为NACL溶液
晶圆级芯片尺寸封装Sn-3.0Ag-0.5Cu焊点跌落失效模式(英文)被引量:3
2016年
依据JEDEC标准采用板级跌落实验研究晶圆级芯片尺寸封装Sn-3.0Ag-0.5Cu焊点的跌落失效模式。发现存在六种失效模式,即发生在印刷电路板(PCB)侧的短FR-4裂纹和完全FR-4裂纹,以及发生在芯片侧的再布线层(RDL)与Cu凸点化层开裂、RDL断裂、体钎料裂纹及体钎料与界面金属间化合物(IMC)混合裂纹。对于最外侧的焊点,由于PCB变形量较大且FR-4介质层强度较低,易于形成完全FR-4裂纹,其可吸收较大的跌落冲击能量,从而避免了其它失效模式的发生。对于内侧的焊点,先形成的短FR-4裂纹对跌落冲击能量的吸收有限,导致在芯片侧发生失效。
黄明亮赵宁刘爽何宜谦
关键词:晶圆级芯片尺寸封装焊点
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