Specially designed fibers are widely used in engineering practice because the specially-designed shape can help to improve the bonding strength of the fiber and the interface. Studied in this paper is the interfacial shear stress transfer behavior on both sides of the specially designed fiber when it is being pulled out; in which automatic analysis of three-dimensional photoelasticity is employed and the finite element method is adopted. The results show that the stress transfer occurs mainly in the region near the fiber＇s embedded end where the stress reaches its critical point, leading to debonding of the interface. Before debonding, as the pullout loading increases, the peak value of shear stress transfers along the fiber from the embedded end to the interior of the matrix, and then stops at the hooked part of the fiber because of its impediment. When the interface begins to debond as the load increases, the shear stress can be transferred to the hooked part.
In the electron moiré method, a high-frequency grating is used to measure microscopic deformation, which promises significant potential applications for the method in the microscopic analysis of materials. However, a special beam scanning control device is required to produce a grating and generate a moiré fringe pattern for the scanning electron microscope （SEM）. Because only a few SEMs used in the material science studies are equipped with this device, the use of the electron moiré method is limited. In this study, an electron moiré method for a common SEM without the beam control device is presented. A grating based on a multi-scanning concept is fabricated in any observing mode. A real-time moiré pattern can also be generated in the SEM or an optical filtering system. Without the beam control device being a prerequisite, the electron moiré method can be more widely used. The experimental results from three different types of SEMs show that high quality gratings with uniform lines and less pitch error can be fabricated by this method, and moiré patterns can also be correctly generated.
